forum.zelfbouwaudio.nl

Henkjan schreef: ↑do 24 aug 2023, 13:07

Henkjan schreef: ↑do 17 aug 2023, 16:50

dan maar de 3 weken wachten op de bezorgchinees

is er al

IMG_20230824_105821Z_HDR.jpg

meteen getest op wat 4700uF die ik nog had liggen, alle 8 zaten dus op ongeveer dit (binnen 1% van elkaar)

ray5150 schreef: ↑do 24 aug 2023, 17:28

Henkjan schreef: ↑do 24 aug 2023, 13:07

Henkjan schreef: ↑do 17 aug 2023, 16:50

dan maar de 3 weken wachten op de bezorgchinees

is er al

IMG_20230824_105821Z_HDR.jpg

meteen getest op wat 4700uF die ik nog had liggen, alle 8 zaten dus op ongeveer dit (binnen 1% van elkaar)

En bevalt ie verder goed ?

Henkjan schreef: ↑do 24 aug 2023, 19:26

ja prima, geeft goede info in beeld. bij een LED ook de spanning bv

wel goed dat ik de verpakking (plastic zakje) niet meteen had weggemikt, daar stond de qr code voor de handleiding op

https://github.com/markus-seidl/component-tester schreef:

Self Adjustment

The self-adjustment measures the resistance and the capacitance of the probe leads, i.e. the PCB, internal wiring and probe leads as a sum, for creating a zero offset. It also measures the internal resistance of the MCU port pins in pull-down and pull-up mode. If the tests are skipped or strange values are measured the default values defined in config.h are used. If everything went fine the tester will display and use the new values gained by the self adjustment (they will be not stored in the EEPROM, see "Save" below).

The voltage offset of the analog comparator is automatically adjusted by the capacitance measurement (in normal probing mode, outside of the self adjustment) if the capacitor is in the range of 100nF up to 3.3µF. Also the offset of the internal bandgap reference is determined in the same way.

Before running the self-adjustment the first time, please measure a film capacitor with a value between 100nF and 3.3µF three times at least to let the tester self-adjust the offsets mentioned above. Typically the first measurement will result in a slightly low value, the second in a high one and the third will be fine. This is caused by the self adjusting offsets. Both offsets are displayed at the end of the self-adjustment.

With a fixed cap for self-adjustment the automatic offset handling in the capacitance measurement is replaced by a dedicated function run during the self-adjustment procedure. So you don't have to measure a film cap before that.

In case the capacitance offsets vary across the probe pairs you can enable probe pair specific offsets in config.h (CAP_MULTIOFFSET).

The self-adjustment is very similar to the self-test regarding the procedure and user interface.

The adjustments steps are:

A1 offsets for bandgap reference and analog comparator (only for fixed cap option)
A2 resistance of probe leads/pins (in 10mOhms)
A3 remove short circuit of probes
A4 MCU's internal pin resistance for Gnd (voltage across RiL)
A5 MCU's internal pin resistance for Vcc (voltage across RiH)
A6 capacitance of probe leads/pins (in pF)

Expected limits:

probe resistance < 1.50 Ohms for two probes in series
probe capacitance < 100pF

Hint: When the resistance values for the probe leads/pins vary too much, there could be a contact problem.

Remember: Adjustment is not calibration! Calibration is the procedure to compare measurement results with a known traceable standard and noting the differences. The goal is to monitor the drift over time. Adjustment is the procedure to adjust a device to meet specific specs.

Chocomel schreef: ↑vr 25 aug 2023, 10:38

..... https://github.com/markus-seidl/component-tester ....

https://github.com/markus-seidl/component-tester schreef:

Self Adjustment

....